GAN, Wenlong. Semiconductor Wafer Defect Detection Based on Machine Learning. Transactions on Computer Science and Intelligent Systems Research, [S. l.], v. 6, p. 128–133, 2024. DOI: 10.62051/wr098130. Disponível em: https://wepub.org/index.php/TCSISR/article/view/3422. Acesso em: 29 apr. 2026.