Phase field simulations of microstructure evolution of monocrystalline and polycrystalline silicon by forced convection

Authors

  • Dianxi Zhang
  • Xiufan Yang
  • Xinmao Qin
  • Huaizhi Wang
  • Qingjiang Song

DOI:

https://doi.org/10.62051/fqjprc80

Keywords:

forced convection; Monocrystalline silicon; Polysilicon; nucleation

Abstract

 In this study, the phase field method was used to numerically simulate single crystal and polycrystalline silicon under the action of forced convection. Following the construction of the phase field model, the effects of parameters such as the degree of undercooling and convection velocity on the growth morphology of monocrystalline and polycrystalline silicon were simulated. The crystal nuclei of different sizes and multi-grain growth conditions of different nucleation times were obtained. The results showed that the growth rate of the upstream tip was the fastest, followed by that of the horizontal direction, and the growth rate of the lower end was the slowest under forced convection. When the undercooling degree was small, anisotropy was not obvious, and grain growth was slow. When the undercooling degree was greater than 0.65, the interface became unstable, and side branches appeared in the direction of the horizontal dendrite arm, while growth was transformed from the non-small crystal plane to the small crystal plane. Under the action of forced convection, the larger the flow velocity, the faster the crystal growth, and the faster the growth speed in the upstream direction of the grain. During the early growth stage, the overall growth rate of the larger initial nuclei was slower than that of the smaller initial nuclei, and subsequently, the difference was not significant. As the grains continued to grow, the thermal diffusion layers of the adjacent grains were in contact with each other, resulting in competitive growth.

Downloads

Download data is not yet available.

References

[1] Sabanskis, A.; Virbulis, J. Simulation of the influence of gas flow on melt convection and phase boundaries in FZ silicon single crystal growth. Journal of Crystal Growth, 2015, 417, 51-57.

[2] Han, X. F.; Liu, X.; Nakano ,S. et al. 3D numerical simulation of free surface shape during the crystal growth of floating zone (FZ) silicon. Journal of Crystal Growth, 2018, 483, 269-274.

[3] G. Ratnieks, A. Muiznieks, A. Muhlbauer, Modeling of phase boundaries for large industrial FZ silicon crystal growth with the needle-eye technique.Joumal of Crystal Growth, 2003, 255, 227-240.

[4] Michael , Wunscher.; Anke, Ludge.; Helge,Riemann. Growth angle and melt meniscus of the RF-heated

[5] Floating zone in silicon crystal growth. Journal of Crystal Growth, 2011, 314,43-47.

[6] P. Chen, Y.L. Tsai, C.W. Lan. Phase field modeling of growth competition of silicon grains. Acta Materialia, 2008, 56, 4114–4122.

[7] T.Aoyama, T; Kuribayshi, K. Influence of undercooling on solid/liquidinterface morphology in semiconductors . Acta Mater, 2000, 48, 3739-3744.

[8] Granasy,L.; Borzsonyi ,T.; Pusztai,T. Crystal nucleation and growth in binary phase-field theory. Phys Rev Lett, 2002, 237, 1813-1817.

[9] Granasy,L.;Borzsonyi ,T.; Pusztai ,T. Phase Field Theory of Heterogeneous Crystal Nucleation Phys Rev Lett, 2007, 98, 035703

[10] F,Wendler.; C, Mennerich.; B, Nestler. A phase-field model for polycrystalline thin film growth, J. Cryst. Growth , 2011, 327, 189-201.

[11] S,Torabi.; J, Lowengrub.; A,Voigt.;S,Wise.;A new phase-field model for strongly anisotropic systems, Proc. R. Soc. A Math. Phys. Eng. Sci, 2009, 465, 1337-1359.

[12] Kasajima,H.;Nagano,E.;Suzuki,T.Phase-field modeling for facet dendrite growth of silicon.Science and Technology of Advanced Materials, 2003, 4, 553-557.

[13] Chen,Z.; Chen,C. L.; Hao,L. M. Numerical simulation of facet dendrite growth. Transactions of Nonferrous Metals Society of China, 2008, 18, 938-943.

[14] Liu,B.Y.;Zhou,Y.Research on interface morphology evolution process of silicon materials using phase field method. Foundry Technology, 2016, 37, 2326-2330.

[15] H.K. Lin, C.W. Lan, Three-dimensional phase field modeling of silicon thin-film growth during directional solidification: facet formation and grain competition, J. Cryst. Growth, 2014, 401,740-747.

[16] S.G. Kim, W.T. Kim, Phase field modeling of dendritic growth with high anisotropy, J. Cryst. Growth, 2005, 275, 355-360.

[17] H. Kasajima, E. Nagano, T. Suzuki, S. Gyoon Kim, W. Tae Kim, Phase-field modeling for facet dendrite growth of silicon. Sci. Technol. Adv. Mater, 2003, 4,553-557.

[18] Yuan,X.F.;Yang,Y.;Liu,F.Interface morphology evolution process of solidification for multicrystalline silicon using phase-field method.Science Technology and Engineering, 2019, 19, 123-128.

[19] Du,L.F.; and Zhang, R. Phase field simulation of dendrite growth with boundary heat flux. Integrating Materials and Manufacturing Innovation, 2014, 3(1) : 1-15.

[20] Chen, G.Y. and H.K. Lin and C.W. Lan. Phase-field modeling of twin-related faceted dendrite growth of silicon. Acta Materialia, 2016, 115 : 324-332.

[21] Tong ,X.; Beckermann, C.; Karma ,A.; and Li,Q. Phase-filed Simulations of Dendritic Crystal Growth in Forced Flow. Phys Rev E, 2001, 63:061601

Downloads

Published

13-09-2024

How to Cite

Zhang, D., Yang, X., Qin, X., Wang, H., & Song, Q. (2024). Phase field simulations of microstructure evolution of monocrystalline and polycrystalline silicon by forced convection. Transactions on Engineering and Technology Research, 3, 12-22. https://doi.org/10.62051/fqjprc80