Chen, Yun, Yufei Hu, Sixu Li, and Chenxu Wang. “Comparative Analysis of Helium-Ion Microscopy and Scanning Electron Microscopy in Nanofabrication and High-Resolution Imaging”. Transactions on Computer Science and Intelligent Systems Research 7 (November 25, 2024): 430–435. Accessed May 14, 2025. https://wepub.org/index.php/TCSISR/article/view/4183.