CHEN, Yun; HU, Yufei; LI, Sixu; WANG , Chenxu. Comparative Analysis of Helium-Ion Microscopy and Scanning Electron Microscopy in Nanofabrication and High-Resolution Imaging. Transactions on Computer Science and Intelligent Systems Research, [S. l.], v. 7, p. 430–435, 2024. DOI: 10.62051/36t3qf31. Disponível em: https://wepub.org/index.php/TCSISR/article/view/4183. Acesso em: 16 may. 2025.