CHEN, Haojun. Dual-Beam Interferometric Study of Epitaxial Layer Thickness Based on Infrared Interferometry. International Journal of Materials Science and Technology Studies, U.K., v. 5, n. 1, p. 29–33, 2026. DOI: 10.62051/ijmsts.v5n1.03. Disponível em: https://wepub.org/index.php/IJMSTS/article/view/5971. Acesso em: 2 aug. 2026.