WANG, Jiale. Power Semiconductor Device Humidity Reliability Study. International Journal of Mechanical and Electrical Engineering, London, U.K., v. 3, n. 2, p. 40–43, 2024. DOI: 10.62051/ijmee.v3n2.07. Disponível em: https://wepub.org/index.php/IJMEE/article/view/3553. Acesso em: 29 apr. 2026.