YANG, Kongping; QI, Yuming. Accelerated Degradation Reliability Modeling Based on Multiple Uncertainty Wiener Processes. International Journal of Mechanical and Electrical Engineering, London, U.K., v. 1, n. 1, p. 109–118, 2023. DOI: 10.62051/ijmee.v1n1.12. Disponível em: https://wepub.org/index.php/IJMEE/article/view/621. Acesso em: 29 apr. 2026.