MA, Yiqing. Calculation of Electronic Structure Properties Of Two-Dimensional AlN/SiC Heterojunction Under Biaxial Stress. International Journal of Computer Science and Information Technology, U.K., v. 3, n. 3, p. 348–356, 2024. DOI: 10.62051/ijcsit.v3n3.36. Disponível em: https://wepub.org/index.php/IJCSIT/article/view/3149. Acesso em: 2 aug. 2026.